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Product Specifications
This section provides details on the Intel SSD 510 Series product specifications.
2.1 Capacity
Notes: 1 GB = 1,000,000,000 bytes; 1 sector = 512 bytes.
LBA count shown represents total user storage capacity and will remain the same throughout the life of the drive.
The total usable capacity of the SSD may be less than the total physical capacity because a small portion of the capacity is
used for NAND flash management and maintenance purposes.
2.2 Performance
Notes:
1. Performance measured using Iometer* with queue depth set to 32; measurements are performed on 8 GB of LBA range.
Write Cache enabled.
2. Performance measured using Iometer with queue depth equal to 32.
3. Write Cache Enabled.
Device measured using Iometer.
Power On To Ready time assumes proper shutdown.
Table 1. User Addressable Sectors
Unformatted Capacity 120 GB 250 GB
Total User Addressable Sectors in LBA Mode 234,441,648 488,397,168
Table 2. Read/Write IOPS, Bandwidth, Latency
Random Read/Write IOPS (Input/Output
Operations Per Second)1 120 GB 250 GB
4K Read (up to) 20,000
4K Write (up to) Up to 8,000
Maximum Sustained Read and Write Bandwidth2 120 GB 250 GB
Sequential Read (up to) 450 MB/s (SATA 6Gb/s)
265 MB/s (SATA 3Gb/s)
500 MB/s (SATA 6Gb/s)
265 MB/s (SATA 3Gb/s)
Sequential Write (up to) 210 MB/s (SATA 6Gb/s)
200 MB/s (SATA 3Gb/s)
315 MB/s (SATA 6Gb/s)
240 MB/s (SATA 3Gb/s)
Latency3 120 GB 250 GB
Read 65 μs
Write 80 μs
Power On to Ready 1.0 s (TYP)
2.3 Electrical Characteristics
Notes:
1. Active power measured during execution of MobileMark* 2007 with DIPM (Device Initiated Power Management) enabled.
2. Idle power defined as SSD at idle with DIPM enabled.
2.4 Environmental Conditions
Notes:
1. Temperature gradient measured without condensation.
2. Shock specifications assume the SSD is mounted securely with the input vibration applied to the drive-mounting screws.
Stimulus may be applied in the X, Y or Z axis. Shock specification is measured using root mean squared (RMS) value.
3. Vibration specifications assume the SSD is mounted securely with the input vibration applied to the drive-mounting
screws. Stimulus may be applied in the X, Y or Z axis. The measured specification is in root mean squared form. Vibration
specification is measured using RMS value.
Table 3. Operating Voltage and Power Consumption
Electrical Characteristics 120 GB 250 GB
Operating Voltage for 5 V (+/- 5%)
Min
Max
4.75 V
5.25 V
Power Consumption (Typical)
Active1
Idle2
380 mW
100 mW
Table 4. Temperature, Shock, Vibration
Temperature Range
Ambient Temperature
Operating
Non-operating
0 - 70 oC
-55 - 95 oC
Temperature Gradient1
Operating
Non-operating
30 (Typical) oC/hr
30 (Typical) oC/hr
Humidity
Operating
Non-operating
5 - 95 %
5 - 95 %
Shock and Vibration Range
Shock2
Operating
Non-operating
1,500 G (Max) at 0.5 msec
1,500 G (Max) at 0.5 msec
Vibration3
Operating
Non-operating
2.17 GRMS (7-800 Hz) Max
3.08 GRMS (7-800
Product Regulatory Compliance
The Intel SSD 510 Series meets or exceeds the regulatory or certification requirements
in Table 5.
Table 5. Product Regulatory Compliance Specifications
Title Description Region for which
conformity declared
European Union Low Voltage
Directive (LVD) 2006/95/EC
EN 60950-1 2nd edition for Information Technology Equipment -
Safety - Part 1: General Requirements European Union
UL/CSA 60950-1, Second Edition
CAN/CSA-C22.2 No. 60950-1-07
Second Edition
Information Technology Equipment - Safety - Part 1:
General Requirements USA/Canada
CFR Title 47 Part 15 Radio Frequency Devices - Subpart B (Unintentional Radiators) USA
ICES-003 Issue 4 Interference Causing Equipment Standard Canada
EN 55022:2006
Information technology equipment -
Radio disturbance characteristics -
Limits and methods of measurement
European Union
CNS 14348:2006
Information technology equipment -
Radio disturbance characteristics -
Limits and methods of measurement
Taiwan
VCCI V3/2010.04
Information technology equipment -
Radio disturbance characteristics -
Limits and methods of measurement
Japan
KN22 (2008-5)
Information technology equipment -
Radio disturbance characteristics -
Limits and methods of measurement
Korea
CISPR 22:2006
Information technology equipment -
Radio disturbance characteristics -
Limits and methods of measurement
International
EN 55024:1998
Information technology equipment -
Immunity characteristics -
Limits and methods of measurement (CISPR 24:1997, modified)
European Union
KN24 (2008-5)
Information technology equipment -
Immunity characteristics -
Limits and methods of measurement (CISPR 24:1997, modified)
Korea
Reliability
The Intel SSD 510 Series meets or exceeds SSD endurance and data retention
requirements as specified in the JESD218 specification.
Reliability specifications are listed in Table 6.
2.7 Hot Plug Support
Hot Plug insertion and removal is supported in the presence of a proper connector and
appropriate operation system, as described in the SATA 2.6 specification.
This product supports asynchronous signal recovery and issues an unsolicited COMINIT
when first mated with a powered connector to guarantee reliable detection by a host
system without hardware device detection.
Table 6. Reliability Specifications
Parameter Value
Uncorrectable Bit Error Rate (UBER) 1 sector in 1016 bits read, max
Uncorrectable bit error rate will not exceed one sector in the
specified number of bits read. In the unlikely event of a
nonrecoverable read error, the SSD will report it as a read failure to
the host; the sector in error is considered corrupt and is not
returned to the host.
Mean Time Between Failure (MTBF) 1,200,000 hours
Mean Time Between Failure is estimated based on Telcordia*
methodology and demonstrated through Reliability Demonstration
Test (RDT).
Power On/Off Cycles 50,000 cycles
Power On/Off Cycles is defined as power being removed from the
SSD, and then restored. Most host systems remove power from the
SSD when entering suspend and hibernate as well as on a system
shutdown.
Minimum Useful Life/Endurance Rating 5 years
The SSD will have a minimum of five years of useful life under
typical client workloads with up to 20 GB of host writes per day.
Insertion Cycles 250 insertion/removal
Signal Descriptions
Note: Key and spacing separate signal and power segments.
Figure 2. Signal and Power Segment Pins
Table 7. Connector Pin Signal Definitions
Pin Function Definition
S1 Ground 1st mate
S2 A+
Differential signal pair A
S3 AS4
Ground 1st mate
S5 BDifferential
signal pair B
S6 B+
S7 Ground 1st mate
Supported Command Sets
The Intel SSD 510 Series supports all mandatory ATA (Advanced Technology
Attachment) commands defined in the ATA8-ACS specification described in this section.
5.1 ATA General Feature Command Set
The Intel SSD 510 Series supports the ATA General Feature command set (non-
PACKET), which consists of:
• EXECUTE DEVICE DIAGNOSTIC
• FLUSH CACHE
• IDENTIFY DEVICE
Note: See Appendix A, “IDENTIFY DEVICE Command Data” on page 21 for details on the sector data
returned after issuing an IDENTIFY DEVICE command.
• READ DMA
• READ SECTOR(S)
• READ VERIFY SECTOR(S)
• SEEK
• SET FEATURES
• WRITE DMA
• WRITE SECTOR(S)
• READ MULTIPLE
• SET MULTIPLE MODE
• WRITE MULTIPLE
The Intel SSD 510 Series also supports the following optional commands:
• READ BUFFFER
• WRITE BUFFER
• NOP
• DOWNLOAD MICROCODE
5.2 Power Management Command Set
The Intel SSD 510 Series supports the Power Management command set, which
consists of:
• CHECK POWER MODE
• IDLE
• IDLE IMMEDIATE
• SLEEP
• STANDBY
• STANDBY IMMEDIATE
Intel® Solid-State Drive 510 Series
Intel® Solid-State Drive 510 Series
Product Specification March 2011
14 Order Number: 325012-001US
5.3 Security Mode Feature Set
The Intel SSD 510 Series supports the Security Mode command set, which consists of:
• SECURITY SET PASSWORD
• SECURITY UNLOCK
• SECURITY ERASE PREPARE
• SECURITY ERASE UNIT
• SECURITY FREEZE LOCK
• SECURITY DISABLE PASSWORD
5.4 SMART Command Set
The Intel SSD 510 Series supports the SMART command set, which consists of:
• SMART READ DATA
• SMART READ ATTRIBUTE THRESHOLDS
• SMART ENABLE/DISABLE ATTRIBUTE AUTOSAVE
• SMART SAVE ATTRIBUTE VALUES
• SMART EXECUTE OFF-LINE IMMEDIATE
• SMART READ LOG SECTOR
• SMART WRITE LOG SECTOR
• SMART ENABLE OPERATIONS
• SMART DISABLE OPERATIONS
• SMART RETURN STATUS
• SMART ENABLE/DISABLE AUTOMATIC OFFLINE
5.4.1 SMART Attributes
Table 9 lists the SMART attributes supported by the Intel SSD 510 Series and the
corresponding status flags and threshold settings.
Table 9. SMART Attributes
ID Attribute
Status Flags1
Threshold
SP EC ER PE OC PW
03h Spin Up Time
Reports a fixed value of zero (0). 1 0 0 0 0 0 0 (none)
04h
Start/Stop Count
Reports a fixed value of zero (0).
1 1 0 0 0 0 0 (none)
05h
Re-allocated Sector Count
The raw value of this attribute shows the
number of retired blocks since leaving the
factory (grown defect count).
1 1 0 0 1 0 0 (none)
Solid-State Drive 510 Series
Note: 1. The following table defines the SMART Attributes status flags.
09h
Power-On Hours Count
Reports the cumulative number of power-on
hours over the life of the device. However,
the On/Off status of the Device Initiated
Power Management (DIPM) feature will
affect the number of hours reported. If DIPM
is turned On, the recorded value for
power-on hours does not include the time
that the device is in a "slumber" state. If
DIPM is turned Off, the recorded value for
power-on hours should match the clock
time, as all three device states are counted:
active, idle and slumber.
1 1 0 0 1 0 0 (none)
0Ch
Power Cycle Count
The raw value of this attribute reports the
cumulative number of power cycle events
over the life of the device.
1 1 0 0 1 0 0 (none)
C0h
Unsafe Shutdown Count
The raw value of this attribute reports the
cumulative number of unsafe (unclean)
shutdown events over the life of the device.
An unsafe shutdown occurs whenever the
device is powered off without STANDBY
IMMEDIATE being the last command.
1 1 0 0 1 0 0 (none)
E1h
Host Writes
The raw value of this attribute reports the
total number of sectors written by the host
system. The raw value is increased by 1 for
every 65,536 sectors (32MB) written by
the host.
1 1 0 0 0 0 0 (none)
E8h
Available Reserved Space
This attribute reports the number of reserve
blocks remaining. The normalized value
begins at 100 (64h), which corresponds to
100 percent availability of the reserved
space. The threshold value for this attribute
is 10 percent availability.
1 1 0 0 1 1 10
E9h
Media Wearout Indicator
This attribute reports the number of cycles
the NAND media has undergone. The
normalized value declines linearly from 100
to 1 as the average erase cycle count
increases from 0 to the maximum rated
cycles.
Once the normalized value reaches 1, the
number will not decrease, although it is likely
that significant additional wear can be put
on the device.
1 1 0 0 1 0 0 (none)
Table 9. SMART Attributes (Continued)
ID Attribute
Status Flags1
Threshold
SP EC ER PE OC PW
Status
Flag Description Value = 0 Value = 1
SP Self-preserving attribute Not a self-preserving attribute Self-preserving attribute
EC Event count attribute Not an event count attribute Event count attribute
ER Error rate attribute Not an error rate attribute Error rate attribute
PE Performance attribute Not a performance attribute Performance attribute
OC Online collection attribute Collected only during offline activity Collected during both offline and
online activity
PW Pre-fail warranty attribute Advisory Pre-fail
S.M.A.R.T. Logs
The Intel SSD 510 Series implements the following Log Addresses: 00h, 02h, 03h, 06h,
and 07h.
The Intel SSD 510 Series implements host vendor specific logs (addresses 80h-9Fh) as
read and write scratchpads, where the default value is zero (0). The Intel SSD 510
Series does not write any specific values to these logs unless directed by the host
through the appropriate commands.
The Intel SSD 510 Series also implements a device vendor specific log at address A9h
as a read-only log area with a default value of zero (0).
5.5 Data Set Management Command Set
The Intel SSD 510 Series supports the Data Set Management command set Trim
attribute, which consists of:
• DATA SET MANAGEMENT
5.6 Host Protected Area Command Set
The Intel SSD 510 Series supports the Host Protected Area command set, which
consists of:
• READ NATIVE MAX ADDRESS
• SET MAX ADDRESS
• READ NATIVE MAX ADDRESS EXT
• SET MAX ADDRESS EXT
The Intel SSD 510 Series also supports the following optional commands:
• SET MAX SET PASSWORD
• SET MAX LOCK
• SET MAX FREEZE LOCK
• SET MAX UNLOCK
5.7 48-Bit Address Command Set
The Intel SSD 510 Series supports the 48-bit Address command set, which consists of:
• FLUSH CACHE EXT
• READ DMA EXT
• READ NATIVE MAX ADDRESS
• READ NATIVE MAX ADDRESS EXT
• READ SECTOR(S) EXT
• READ VERIFY SECTOR(S) EXT
• SET MAX ADDRESS EXT
• WRITE DMA EXT
• WRITE MULTIPLE EXT
• WRITE SECTOR(S) EXT
Intel® Solid-State Drive 510 Series
March 2011 Product Specification
Order Number: 325012-001US 17
Intel® Solid-State Drive 510 Series
5.8 Device Configuration Overlay Command Set
The Intel SSD 510 Series supports the Device Configuration Overlay command set, which
consists of:
• DEVICE CONFIGURATION FREEZE LOCK
• DEVICE CONFIGURATION IDENTITY
• DEVICE CONFIGURATION RESTORE
• DEVICE CONFIGURATION SET
5.9 General Purpose Log Command Set
The Intel SSD 510 Series supports the General Purpose Log command set, which
consists of:
• READ LOG EXT
• WRITE LOG EXT
5.10 Native Command Queuing
The Intel SSD 510 Series supports the Native Command Queuing (NCQ) command set,
which includes:
• READ FPDMA QUEUED
• WRITE FPDMA QUEUED
Note: With a maximum queue depth equal to 32.
5.11 Software Settings Preservation
The Intel SSD 510 Series supports the SET FEATURES parameter to enable/disable the
preservation of software settings.
5.12 Device Initiated Power Management (DIPM)
The Intel SSD 510 Series supports the SET FEATURES parameter to enable Device
Initiated Power Management.
Intel® Solid-State Drive 510 Series
Intel® Solid-State Drive 510 Series
Product Specification March 2011
18 Order Number: 325012-001US
6.0 Certifications and Declarations
Table 10 describes the Device Certifications supported by the Intel SSD 510 Series.
7.0 References
Table 11 identifies the standards information referenced in this document.
Table 10. Device Certifications and Declarations
Certification Description
CE Compliant Indicates conformity with the essential health and safety requirements described in European
Directives Low Voltage Directive and EMC Directive.
UL Recognized Underwriters Laboratories, Inc. Component Recognition UL60950-1.
C-Tick Compliant Compliance with the Australia/New Zealand Standard AS/NZS3548 and Electromagnetic
Compatibility (EMC) Framework requirements of the Australian Communication Authority (ACA).
BSMI Compliant Compliance to the Taiwan EMC standard “Limits and methods of measurement of radio disturbance
characteristics of information technology equipment, CNS 13438 Class B.”
KCC
Compliance with paragraph 1 of Article 11 of the Electromagnetic Compatibility Control Regulation
and meets the Electromagnetic Compatibility (EMC) Framework requirements of the Radio Research
Laboratory (RRL) Ministry of Information and Communication Republic of Korea.
Microsoft WHQL Microsoft Windows Hardware Quality Labs.
RoHS Compliant Meets European Restrictions of Hazardous Substance Directive.
VCCI Voluntary Control Council for Interface to cope with disturbance problems caused by personal
computers or facsimile.
SATA-IO Indicates certified logo program from Serial ATA International Organization.
Table 11. Standards References
Date or
Rev. # Title Location
Sept 2010
Solid-State Drive (SSD) Requirements and Endurance Test Method
(JESD218)
http://www.jedec.org/standardsdocuments/
docs/jesd218
Dec 2008 VCCI http://www.vcci.jp/vcci_e/
June 2009 RoHS Search for material description datasheet
at http://qdms.intel.com/
August 2009 ATA8-ACS Specification http://www.t13.org/
June 2009 Serial ATA Revision 3.0 http://www.sata-io.org
May 2006 SFF-8223, 2.5-inch Drive w/Serial Attachment Connector http://www.sffcommittee.org
May 2005 SFF-8201, 2.5-inch drive form factor http://www.sffcommittee.org
1995
1996
1995
1995
1997
1994
International Electrotechnical Commission EN 61000
4-2 (Electrostatic discharge immunity test)
4-3 (Radiated, radio-frequency, electromagnetic field immunity test)
4-4 (Electrical fast transient/burst immunity test)
4-5 (Surge immunity test)
4-6 (Immunity to conducted disturbances, induced by radiofrequency
fields)
4-11 (Voltage Variations, voltage dips, short interruptions and
voltage variations immunity tests)
http://www.iec.ch
1995 ENV 50204
(Radiated electromagnetic field from digital radio telephones)
http://www.dbicorporation.com/
radimmun.htm
Intel® Solid-State Drive 510 Series
March 2011 Product Specification
Order Number: 325012-001US 19
Intel® Solid-State Drive 510 Series
8.0 Terms and Acronyms
Table 12 defines the terms and acronyms used in this document.
Table 12. Glossary of Terms and Acronyms
Term Definition
ATA Advanced Technology Attachment
DAS Device Activity Signal
DIPM Device Initiated Power Management
DMA Direct Memory Access
EXT Extended
FPDMA First Party Direct Memory Access
GB
Gigabyte
Note: The total usable capacity of the SSD may be less than the total physical capacity because a
small portion of the capacity is used for NAND flash management and maintenance purposes.
Gb Gigabit
HDD Hard Disk Drive
KB Kilobyte
I/O Input/Output
IOPS Input/Output Operations Per Second
ISO International Standards Organization
LBA Logical Block Address
MB Megabyte
MLC Multi-level Cell
MTBF Mean Time Between Failures
NCQ Native Command Queuing
NOP No Operation
PIO Programmed Input/Output
RDT Reliability Demonstration Test
RMS Root Mean Square
RoHS Restriction of Hazardous Substances
SATA Serial Advanced Technology Attachment
SMART
Self-Monitoring, Analysis and Reporting Technology
An open standard for developing hard drives and software systems that automatically monitors the
health of a drive and reports potential problems.
SSD Solid-State Drive
TYP Typical
UBER Uncorrectable Bit Error Rate
VCCI Voluntary Control Council for Interface
WHQL Microsoft* Windows Hardware Quality Labs
Intel® Solid-State Drive 510 Series
Intel® Solid-State Drive 510 Series
Product Specification March 2011
20 Order Number: 325012-001US
9.0 Revision History
Date Revision Description
March 2011 001 Initial Release.
Intel® Solid-State Drive 510 Series
March 2011 Product Specification
Order Number: 325012-001US 21
Intel® Solid-State Drive 510 Series
Appendix A IDENTIFY DEVICE Command Data
Table 13 details the sector data returned after issuing an IDENTIFY DEVICE command.
Table 13. Returned Sector Data
Word
F = Fixed
V = Variable
X = Both
Default Value Description
0 F 0040h General configuration bit-significant information
1 X 3FFFh Obsolete - Number of logical cylinders (16,383)
2 V C837h Specific configuration
3 X 0010h Obsolete - Number of logical heads (16)
4-5 X 0h Retired
6 X 003Fh Obsolete - Number of logical sectors per logical track (63)
7-8 V 0h Reserved for assignment by the CompactFlash* Association (CFA)
9 X 0h Retired
10-19 F varies Serial number (20 ASCII characters)
20-21 X 0h Retired
22 X 0h Obsolete
23-26 F varies Firmware revision (8 ASCII characters)
27-46 F varies Model number (Intel® Solid-State Drive)
47 F 8010h 7:0—Maximum number of sectors transferred per interrupt on multiple
commands
48 F 4000h Reserved
49 F 2F00h Capabilities
50 F 4000h Capabilities
51-52 X 0h Obsolete
53 F 0007h Words 88 and 70:64 valid
54 X 3FFFh Obsolete - Number of logical cylinders (16,383)
55 X 0010h Obsolete - Number of logical heads (16)
56 X 003Fh Obsolete - Number of logical sectors per logical track (63)
57-58 X 00FBFC10h Obsolete
59 F 0101h Number of sectors transferred per interrupt on multiple commands
60-62 F
120 GB: 0DF94BB0h
Total number of user-addressable sectors
250 GB: 0FFFFFFFh
63 F 0007h Multi-word DMA modes supported/selected
64 F 0003h PIO modes supported
65 F 0078h Minimum multiword DMA transfer cycle time per word
66 F 0078h Manufacturer’s recommended multiword DMA transfer cycle time
67 F 0078h Minimum PIO transfer cycle time without flow control
68 F 0078h Minimum PIO transfer cycle time with IORDY flow control
69 F 0000h Additional Supported
70 F 0000h Reserved
71-74 F 0h Reserved for IDENTIFY PACKET DEVICE command
Intel® Solid-State Drive 510 Series
Intel® Solid-State Drive 510 Series
Product Specification March 2011
22 Order Number: 325012-001US
75 F 001Fh Queue depth
76 F 070Eh Serial ATA capabilities
77 F 0h Reserved for future Serial ATA definition
78 F 004Ch Serial ATA features supported
79 V 0040h Serial ATA features enabled
80 F 01FCh Major version number
81 F 0107h Minor version number
82 F 746Bh Command set supported
83 F 7D01h Command sets supported
84 F 6163h Command set/feature supported extension
85 V 7469h Command set/feature enabled
86 V BC01h Command set/feature enabled
87 V 6163h Command set/feature default
88 V 407Fh Ultra DMA Modes
89 F 0001h Time required for security erase unit completion
90 F 0001h Time required for enhanced security erase completion
91 V 0h Current advanced power management value
92 V FFFEh Master Password Revision Code
93 F 0h Hardware reset result: the contents of bits (12:0) of this word shall
change only during the execution of a hardware reset
94 V 0h Vendor’s recommended and actual acoustic management value
95 F 0h Stream minimum request size
96 V 0h Streaming transfer time - DMA
97 V 0h Streaming access latency - DMA and PIO
98-99 F 0h Streaming performance granularity
100-103 V
120GB: 0DF94BB0h
250GB: 1D1C5970h
Maximum user LBA for 48-bit address feature set
104 V 0h Streaming transfer time - PIO
105 F 0008h Reserved
106 F 4000h Physical sector size / logical sector size
107 F 0h Inter-seek delay for ISO-7779 acoustic testing in microseconds
108-111 F varies Unique ID
112-115 F 0h Reserved for world wide name extension to 128 bits
116 V 0h Reserved for technical report
117-118 F 0h Words per logical sector
119 F 4010h Supported settings
120 F 4010h Command set/feature enabled/supported
121-126 F 0h Reserved
127 F 0h Removable Media Status Notification feature set support
128 V 0021h Security status
Table 13. Returned Sector Data (Continued)
Word
F = Fixed
V = Variable
X = Both
Default Value Description
Intel® Solid-State Drive 510 Series
March 2011 Product Specification
Order Number: 325012-001US 23
Drive 510 Series
Notes: F = Fixed. The content of the word is fixed and does not change. For removable media devices, these values may change
when media is removed or changed.
V = Variable. The state of at least one bit in a word is variable and may change depending on the state of the device or
the commands executed by the device.
X = F or V. The content of the word may be fixed or variable.
129-159 X 0h Vendor-specific
160 F 0h CompactFlash Association (CFA) power mode 1
161-168 X 0h Reserved for assignment by the CFA
169 X 0001h Data set management Trim attribute support
170-175 X 0h Reserved for assignment by the CFA
176-205 V 0h Current media serial number
206 X 003Dh SCT Command Transport
207-208 X 0000h Reserved
209 X 0000h Alignment of logical blocks within a physical block
210-211 X 0000h Write-Read-Verify Sector Count Mode 3 (DWord)
212-213 X 0000h Write-Read-Verify Sector Count Mode 2 (DWord)
214 X 0000h NV Cache Capabilities
215-216 X 0000h NV Cache Size in Logical Blocks (DWord)
217 X 0001h Nominal media rotation rate
218 X 0000h Reserved
219 X 0000h NV Cache Options
220 X 0000h Write-Read-Verify feature set
221 X 0000h Reserved
222 X 103Fh Transport major version number
223 X 0000h Transport minor version number
224-229 X 0000h Reserved
230-233 X 0000h Extended Number of User Addressable Sectors (QWord)
234 X 0001h Minimum number of 512-byte data blocks per DOWNLOAD MICROCODE
command for mode 03h
235 X 0200h Maximum number of 512-byte data blocks per DOWNLOAD MICROCODE
command for mode 03h
236-254 X 0000h Reserved
255 X varies Integrity word
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This section provides details on the Intel SSD 510 Series product specifications.
2.1 Capacity
Notes: 1 GB = 1,000,000,000 bytes; 1 sector = 512 bytes.
LBA count shown represents total user storage capacity and will remain the same throughout the life of the drive.
The total usable capacity of the SSD may be less than the total physical capacity because a small portion of the capacity is
used for NAND flash management and maintenance purposes.
2.2 Performance
Notes:
1. Performance measured using Iometer* with queue depth set to 32; measurements are performed on 8 GB of LBA range.
Write Cache enabled.
2. Performance measured using Iometer with queue depth equal to 32.
3. Write Cache Enabled.
Device measured using Iometer.
Power On To Ready time assumes proper shutdown.
Table 1. User Addressable Sectors
Unformatted Capacity 120 GB 250 GB
Total User Addressable Sectors in LBA Mode 234,441,648 488,397,168
Table 2. Read/Write IOPS, Bandwidth, Latency
Random Read/Write IOPS (Input/Output
Operations Per Second)1 120 GB 250 GB
4K Read (up to) 20,000
4K Write (up to) Up to 8,000
Maximum Sustained Read and Write Bandwidth2 120 GB 250 GB
Sequential Read (up to) 450 MB/s (SATA 6Gb/s)
265 MB/s (SATA 3Gb/s)
500 MB/s (SATA 6Gb/s)
265 MB/s (SATA 3Gb/s)
Sequential Write (up to) 210 MB/s (SATA 6Gb/s)
200 MB/s (SATA 3Gb/s)
315 MB/s (SATA 6Gb/s)
240 MB/s (SATA 3Gb/s)
Latency3 120 GB 250 GB
Read 65 μs
Write 80 μs
Power On to Ready 1.0 s (TYP)
2.3 Electrical Characteristics
Notes:
1. Active power measured during execution of MobileMark* 2007 with DIPM (Device Initiated Power Management) enabled.
2. Idle power defined as SSD at idle with DIPM enabled.
2.4 Environmental Conditions
Notes:
1. Temperature gradient measured without condensation.
2. Shock specifications assume the SSD is mounted securely with the input vibration applied to the drive-mounting screws.
Stimulus may be applied in the X, Y or Z axis. Shock specification is measured using root mean squared (RMS) value.
3. Vibration specifications assume the SSD is mounted securely with the input vibration applied to the drive-mounting
screws. Stimulus may be applied in the X, Y or Z axis. The measured specification is in root mean squared form. Vibration
specification is measured using RMS value.
Table 3. Operating Voltage and Power Consumption
Electrical Characteristics 120 GB 250 GB
Operating Voltage for 5 V (+/- 5%)
Min
Max
4.75 V
5.25 V
Power Consumption (Typical)
Active1
Idle2
380 mW
100 mW
Table 4. Temperature, Shock, Vibration
Temperature Range
Ambient Temperature
Operating
Non-operating
0 - 70 oC
-55 - 95 oC
Temperature Gradient1
Operating
Non-operating
30 (Typical) oC/hr
30 (Typical) oC/hr
Humidity
Operating
Non-operating
5 - 95 %
5 - 95 %
Shock and Vibration Range
Shock2
Operating
Non-operating
1,500 G (Max) at 0.5 msec
1,500 G (Max) at 0.5 msec
Vibration3
Operating
Non-operating
2.17 GRMS (7-800 Hz) Max
3.08 GRMS (7-800
Product Regulatory Compliance
The Intel SSD 510 Series meets or exceeds the regulatory or certification requirements
in Table 5.
Table 5. Product Regulatory Compliance Specifications
Title Description Region for which
conformity declared
European Union Low Voltage
Directive (LVD) 2006/95/EC
EN 60950-1 2nd edition for Information Technology Equipment -
Safety - Part 1: General Requirements European Union
UL/CSA 60950-1, Second Edition
CAN/CSA-C22.2 No. 60950-1-07
Second Edition
Information Technology Equipment - Safety - Part 1:
General Requirements USA/Canada
CFR Title 47 Part 15 Radio Frequency Devices - Subpart B (Unintentional Radiators) USA
ICES-003 Issue 4 Interference Causing Equipment Standard Canada
EN 55022:2006
Information technology equipment -
Radio disturbance characteristics -
Limits and methods of measurement
European Union
CNS 14348:2006
Information technology equipment -
Radio disturbance characteristics -
Limits and methods of measurement
Taiwan
VCCI V3/2010.04
Information technology equipment -
Radio disturbance characteristics -
Limits and methods of measurement
Japan
KN22 (2008-5)
Information technology equipment -
Radio disturbance characteristics -
Limits and methods of measurement
Korea
CISPR 22:2006
Information technology equipment -
Radio disturbance characteristics -
Limits and methods of measurement
International
EN 55024:1998
Information technology equipment -
Immunity characteristics -
Limits and methods of measurement (CISPR 24:1997, modified)
European Union
KN24 (2008-5)
Information technology equipment -
Immunity characteristics -
Limits and methods of measurement (CISPR 24:1997, modified)
Korea
Reliability
The Intel SSD 510 Series meets or exceeds SSD endurance and data retention
requirements as specified in the JESD218 specification.
Reliability specifications are listed in Table 6.
2.7 Hot Plug Support
Hot Plug insertion and removal is supported in the presence of a proper connector and
appropriate operation system, as described in the SATA 2.6 specification.
This product supports asynchronous signal recovery and issues an unsolicited COMINIT
when first mated with a powered connector to guarantee reliable detection by a host
system without hardware device detection.
Table 6. Reliability Specifications
Parameter Value
Uncorrectable Bit Error Rate (UBER) 1 sector in 1016 bits read, max
Uncorrectable bit error rate will not exceed one sector in the
specified number of bits read. In the unlikely event of a
nonrecoverable read error, the SSD will report it as a read failure to
the host; the sector in error is considered corrupt and is not
returned to the host.
Mean Time Between Failure (MTBF) 1,200,000 hours
Mean Time Between Failure is estimated based on Telcordia*
methodology and demonstrated through Reliability Demonstration
Test (RDT).
Power On/Off Cycles 50,000 cycles
Power On/Off Cycles is defined as power being removed from the
SSD, and then restored. Most host systems remove power from the
SSD when entering suspend and hibernate as well as on a system
shutdown.
Minimum Useful Life/Endurance Rating 5 years
The SSD will have a minimum of five years of useful life under
typical client workloads with up to 20 GB of host writes per day.
Insertion Cycles 250 insertion/removal
Signal Descriptions
Note: Key and spacing separate signal and power segments.
Figure 2. Signal and Power Segment Pins
Table 7. Connector Pin Signal Definitions
Pin Function Definition
S1 Ground 1st mate
S2 A+
Differential signal pair A
S3 AS4
Ground 1st mate
S5 BDifferential
signal pair B
S6 B+
S7 Ground 1st mate
Supported Command Sets
The Intel SSD 510 Series supports all mandatory ATA (Advanced Technology
Attachment) commands defined in the ATA8-ACS specification described in this section.
5.1 ATA General Feature Command Set
The Intel SSD 510 Series supports the ATA General Feature command set (non-
PACKET), which consists of:
• EXECUTE DEVICE DIAGNOSTIC
• FLUSH CACHE
• IDENTIFY DEVICE
Note: See Appendix A, “IDENTIFY DEVICE Command Data” on page 21 for details on the sector data
returned after issuing an IDENTIFY DEVICE command.
• READ DMA
• READ SECTOR(S)
• READ VERIFY SECTOR(S)
• SEEK
• SET FEATURES
• WRITE DMA
• WRITE SECTOR(S)
• READ MULTIPLE
• SET MULTIPLE MODE
• WRITE MULTIPLE
The Intel SSD 510 Series also supports the following optional commands:
• READ BUFFFER
• WRITE BUFFER
• NOP
• DOWNLOAD MICROCODE
5.2 Power Management Command Set
The Intel SSD 510 Series supports the Power Management command set, which
consists of:
• CHECK POWER MODE
• IDLE
• IDLE IMMEDIATE
• SLEEP
• STANDBY
• STANDBY IMMEDIATE
Intel® Solid-State Drive 510 Series
Intel® Solid-State Drive 510 Series
Product Specification March 2011
14 Order Number: 325012-001US
5.3 Security Mode Feature Set
The Intel SSD 510 Series supports the Security Mode command set, which consists of:
• SECURITY SET PASSWORD
• SECURITY UNLOCK
• SECURITY ERASE PREPARE
• SECURITY ERASE UNIT
• SECURITY FREEZE LOCK
• SECURITY DISABLE PASSWORD
5.4 SMART Command Set
The Intel SSD 510 Series supports the SMART command set, which consists of:
• SMART READ DATA
• SMART READ ATTRIBUTE THRESHOLDS
• SMART ENABLE/DISABLE ATTRIBUTE AUTOSAVE
• SMART SAVE ATTRIBUTE VALUES
• SMART EXECUTE OFF-LINE IMMEDIATE
• SMART READ LOG SECTOR
• SMART WRITE LOG SECTOR
• SMART ENABLE OPERATIONS
• SMART DISABLE OPERATIONS
• SMART RETURN STATUS
• SMART ENABLE/DISABLE AUTOMATIC OFFLINE
5.4.1 SMART Attributes
Table 9 lists the SMART attributes supported by the Intel SSD 510 Series and the
corresponding status flags and threshold settings.
Table 9. SMART Attributes
ID Attribute
Status Flags1
Threshold
SP EC ER PE OC PW
03h Spin Up Time
Reports a fixed value of zero (0). 1 0 0 0 0 0 0 (none)
04h
Start/Stop Count
Reports a fixed value of zero (0).
1 1 0 0 0 0 0 (none)
05h
Re-allocated Sector Count
The raw value of this attribute shows the
number of retired blocks since leaving the
factory (grown defect count).
1 1 0 0 1 0 0 (none)
Solid-State Drive 510 Series
Note: 1. The following table defines the SMART Attributes status flags.
09h
Power-On Hours Count
Reports the cumulative number of power-on
hours over the life of the device. However,
the On/Off status of the Device Initiated
Power Management (DIPM) feature will
affect the number of hours reported. If DIPM
is turned On, the recorded value for
power-on hours does not include the time
that the device is in a "slumber" state. If
DIPM is turned Off, the recorded value for
power-on hours should match the clock
time, as all three device states are counted:
active, idle and slumber.
1 1 0 0 1 0 0 (none)
0Ch
Power Cycle Count
The raw value of this attribute reports the
cumulative number of power cycle events
over the life of the device.
1 1 0 0 1 0 0 (none)
C0h
Unsafe Shutdown Count
The raw value of this attribute reports the
cumulative number of unsafe (unclean)
shutdown events over the life of the device.
An unsafe shutdown occurs whenever the
device is powered off without STANDBY
IMMEDIATE being the last command.
1 1 0 0 1 0 0 (none)
E1h
Host Writes
The raw value of this attribute reports the
total number of sectors written by the host
system. The raw value is increased by 1 for
every 65,536 sectors (32MB) written by
the host.
1 1 0 0 0 0 0 (none)
E8h
Available Reserved Space
This attribute reports the number of reserve
blocks remaining. The normalized value
begins at 100 (64h), which corresponds to
100 percent availability of the reserved
space. The threshold value for this attribute
is 10 percent availability.
1 1 0 0 1 1 10
E9h
Media Wearout Indicator
This attribute reports the number of cycles
the NAND media has undergone. The
normalized value declines linearly from 100
to 1 as the average erase cycle count
increases from 0 to the maximum rated
cycles.
Once the normalized value reaches 1, the
number will not decrease, although it is likely
that significant additional wear can be put
on the device.
1 1 0 0 1 0 0 (none)
Table 9. SMART Attributes (Continued)
ID Attribute
Status Flags1
Threshold
SP EC ER PE OC PW
Status
Flag Description Value = 0 Value = 1
SP Self-preserving attribute Not a self-preserving attribute Self-preserving attribute
EC Event count attribute Not an event count attribute Event count attribute
ER Error rate attribute Not an error rate attribute Error rate attribute
PE Performance attribute Not a performance attribute Performance attribute
OC Online collection attribute Collected only during offline activity Collected during both offline and
online activity
PW Pre-fail warranty attribute Advisory Pre-fail
S.M.A.R.T. Logs
The Intel SSD 510 Series implements the following Log Addresses: 00h, 02h, 03h, 06h,
and 07h.
The Intel SSD 510 Series implements host vendor specific logs (addresses 80h-9Fh) as
read and write scratchpads, where the default value is zero (0). The Intel SSD 510
Series does not write any specific values to these logs unless directed by the host
through the appropriate commands.
The Intel SSD 510 Series also implements a device vendor specific log at address A9h
as a read-only log area with a default value of zero (0).
5.5 Data Set Management Command Set
The Intel SSD 510 Series supports the Data Set Management command set Trim
attribute, which consists of:
• DATA SET MANAGEMENT
5.6 Host Protected Area Command Set
The Intel SSD 510 Series supports the Host Protected Area command set, which
consists of:
• READ NATIVE MAX ADDRESS
• SET MAX ADDRESS
• READ NATIVE MAX ADDRESS EXT
• SET MAX ADDRESS EXT
The Intel SSD 510 Series also supports the following optional commands:
• SET MAX SET PASSWORD
• SET MAX LOCK
• SET MAX FREEZE LOCK
• SET MAX UNLOCK
5.7 48-Bit Address Command Set
The Intel SSD 510 Series supports the 48-bit Address command set, which consists of:
• FLUSH CACHE EXT
• READ DMA EXT
• READ NATIVE MAX ADDRESS
• READ NATIVE MAX ADDRESS EXT
• READ SECTOR(S) EXT
• READ VERIFY SECTOR(S) EXT
• SET MAX ADDRESS EXT
• WRITE DMA EXT
• WRITE MULTIPLE EXT
• WRITE SECTOR(S) EXT
Intel® Solid-State Drive 510 Series
March 2011 Product Specification
Order Number: 325012-001US 17
Intel® Solid-State Drive 510 Series
5.8 Device Configuration Overlay Command Set
The Intel SSD 510 Series supports the Device Configuration Overlay command set, which
consists of:
• DEVICE CONFIGURATION FREEZE LOCK
• DEVICE CONFIGURATION IDENTITY
• DEVICE CONFIGURATION RESTORE
• DEVICE CONFIGURATION SET
5.9 General Purpose Log Command Set
The Intel SSD 510 Series supports the General Purpose Log command set, which
consists of:
• READ LOG EXT
• WRITE LOG EXT
5.10 Native Command Queuing
The Intel SSD 510 Series supports the Native Command Queuing (NCQ) command set,
which includes:
• READ FPDMA QUEUED
• WRITE FPDMA QUEUED
Note: With a maximum queue depth equal to 32.
5.11 Software Settings Preservation
The Intel SSD 510 Series supports the SET FEATURES parameter to enable/disable the
preservation of software settings.
5.12 Device Initiated Power Management (DIPM)
The Intel SSD 510 Series supports the SET FEATURES parameter to enable Device
Initiated Power Management.
Intel® Solid-State Drive 510 Series
Intel® Solid-State Drive 510 Series
Product Specification March 2011
18 Order Number: 325012-001US
6.0 Certifications and Declarations
Table 10 describes the Device Certifications supported by the Intel SSD 510 Series.
7.0 References
Table 11 identifies the standards information referenced in this document.
Table 10. Device Certifications and Declarations
Certification Description
CE Compliant Indicates conformity with the essential health and safety requirements described in European
Directives Low Voltage Directive and EMC Directive.
UL Recognized Underwriters Laboratories, Inc. Component Recognition UL60950-1.
C-Tick Compliant Compliance with the Australia/New Zealand Standard AS/NZS3548 and Electromagnetic
Compatibility (EMC) Framework requirements of the Australian Communication Authority (ACA).
BSMI Compliant Compliance to the Taiwan EMC standard “Limits and methods of measurement of radio disturbance
characteristics of information technology equipment, CNS 13438 Class B.”
KCC
Compliance with paragraph 1 of Article 11 of the Electromagnetic Compatibility Control Regulation
and meets the Electromagnetic Compatibility (EMC) Framework requirements of the Radio Research
Laboratory (RRL) Ministry of Information and Communication Republic of Korea.
Microsoft WHQL Microsoft Windows Hardware Quality Labs.
RoHS Compliant Meets European Restrictions of Hazardous Substance Directive.
VCCI Voluntary Control Council for Interface to cope with disturbance problems caused by personal
computers or facsimile.
SATA-IO Indicates certified logo program from Serial ATA International Organization.
Table 11. Standards References
Date or
Rev. # Title Location
Sept 2010
Solid-State Drive (SSD) Requirements and Endurance Test Method
(JESD218)
http://www.jedec.org/standardsdocuments/
docs/jesd218
Dec 2008 VCCI http://www.vcci.jp/vcci_e/
June 2009 RoHS Search for material description datasheet
at http://qdms.intel.com/
August 2009 ATA8-ACS Specification http://www.t13.org/
June 2009 Serial ATA Revision 3.0 http://www.sata-io.org
May 2006 SFF-8223, 2.5-inch Drive w/Serial Attachment Connector http://www.sffcommittee.org
May 2005 SFF-8201, 2.5-inch drive form factor http://www.sffcommittee.org
1995
1996
1995
1995
1997
1994
International Electrotechnical Commission EN 61000
4-2 (Electrostatic discharge immunity test)
4-3 (Radiated, radio-frequency, electromagnetic field immunity test)
4-4 (Electrical fast transient/burst immunity test)
4-5 (Surge immunity test)
4-6 (Immunity to conducted disturbances, induced by radiofrequency
fields)
4-11 (Voltage Variations, voltage dips, short interruptions and
voltage variations immunity tests)
http://www.iec.ch
1995 ENV 50204
(Radiated electromagnetic field from digital radio telephones)
http://www.dbicorporation.com/
radimmun.htm
Intel® Solid-State Drive 510 Series
March 2011 Product Specification
Order Number: 325012-001US 19
Intel® Solid-State Drive 510 Series
8.0 Terms and Acronyms
Table 12 defines the terms and acronyms used in this document.
Table 12. Glossary of Terms and Acronyms
Term Definition
ATA Advanced Technology Attachment
DAS Device Activity Signal
DIPM Device Initiated Power Management
DMA Direct Memory Access
EXT Extended
FPDMA First Party Direct Memory Access
GB
Gigabyte
Note: The total usable capacity of the SSD may be less than the total physical capacity because a
small portion of the capacity is used for NAND flash management and maintenance purposes.
Gb Gigabit
HDD Hard Disk Drive
KB Kilobyte
I/O Input/Output
IOPS Input/Output Operations Per Second
ISO International Standards Organization
LBA Logical Block Address
MB Megabyte
MLC Multi-level Cell
MTBF Mean Time Between Failures
NCQ Native Command Queuing
NOP No Operation
PIO Programmed Input/Output
RDT Reliability Demonstration Test
RMS Root Mean Square
RoHS Restriction of Hazardous Substances
SATA Serial Advanced Technology Attachment
SMART
Self-Monitoring, Analysis and Reporting Technology
An open standard for developing hard drives and software systems that automatically monitors the
health of a drive and reports potential problems.
SSD Solid-State Drive
TYP Typical
UBER Uncorrectable Bit Error Rate
VCCI Voluntary Control Council for Interface
WHQL Microsoft* Windows Hardware Quality Labs
Intel® Solid-State Drive 510 Series
Intel® Solid-State Drive 510 Series
Product Specification March 2011
20 Order Number: 325012-001US
9.0 Revision History
Date Revision Description
March 2011 001 Initial Release.
Intel® Solid-State Drive 510 Series
March 2011 Product Specification
Order Number: 325012-001US 21
Intel® Solid-State Drive 510 Series
Appendix A IDENTIFY DEVICE Command Data
Table 13 details the sector data returned after issuing an IDENTIFY DEVICE command.
Table 13. Returned Sector Data
Word
F = Fixed
V = Variable
X = Both
Default Value Description
0 F 0040h General configuration bit-significant information
1 X 3FFFh Obsolete - Number of logical cylinders (16,383)
2 V C837h Specific configuration
3 X 0010h Obsolete - Number of logical heads (16)
4-5 X 0h Retired
6 X 003Fh Obsolete - Number of logical sectors per logical track (63)
7-8 V 0h Reserved for assignment by the CompactFlash* Association (CFA)
9 X 0h Retired
10-19 F varies Serial number (20 ASCII characters)
20-21 X 0h Retired
22 X 0h Obsolete
23-26 F varies Firmware revision (8 ASCII characters)
27-46 F varies Model number (Intel® Solid-State Drive)
47 F 8010h 7:0—Maximum number of sectors transferred per interrupt on multiple
commands
48 F 4000h Reserved
49 F 2F00h Capabilities
50 F 4000h Capabilities
51-52 X 0h Obsolete
53 F 0007h Words 88 and 70:64 valid
54 X 3FFFh Obsolete - Number of logical cylinders (16,383)
55 X 0010h Obsolete - Number of logical heads (16)
56 X 003Fh Obsolete - Number of logical sectors per logical track (63)
57-58 X 00FBFC10h Obsolete
59 F 0101h Number of sectors transferred per interrupt on multiple commands
60-62 F
120 GB: 0DF94BB0h
Total number of user-addressable sectors
250 GB: 0FFFFFFFh
63 F 0007h Multi-word DMA modes supported/selected
64 F 0003h PIO modes supported
65 F 0078h Minimum multiword DMA transfer cycle time per word
66 F 0078h Manufacturer’s recommended multiword DMA transfer cycle time
67 F 0078h Minimum PIO transfer cycle time without flow control
68 F 0078h Minimum PIO transfer cycle time with IORDY flow control
69 F 0000h Additional Supported
70 F 0000h Reserved
71-74 F 0h Reserved for IDENTIFY PACKET DEVICE command
Intel® Solid-State Drive 510 Series
Intel® Solid-State Drive 510 Series
Product Specification March 2011
22 Order Number: 325012-001US
75 F 001Fh Queue depth
76 F 070Eh Serial ATA capabilities
77 F 0h Reserved for future Serial ATA definition
78 F 004Ch Serial ATA features supported
79 V 0040h Serial ATA features enabled
80 F 01FCh Major version number
81 F 0107h Minor version number
82 F 746Bh Command set supported
83 F 7D01h Command sets supported
84 F 6163h Command set/feature supported extension
85 V 7469h Command set/feature enabled
86 V BC01h Command set/feature enabled
87 V 6163h Command set/feature default
88 V 407Fh Ultra DMA Modes
89 F 0001h Time required for security erase unit completion
90 F 0001h Time required for enhanced security erase completion
91 V 0h Current advanced power management value
92 V FFFEh Master Password Revision Code
93 F 0h Hardware reset result: the contents of bits (12:0) of this word shall
change only during the execution of a hardware reset
94 V 0h Vendor’s recommended and actual acoustic management value
95 F 0h Stream minimum request size
96 V 0h Streaming transfer time - DMA
97 V 0h Streaming access latency - DMA and PIO
98-99 F 0h Streaming performance granularity
100-103 V
120GB: 0DF94BB0h
250GB: 1D1C5970h
Maximum user LBA for 48-bit address feature set
104 V 0h Streaming transfer time - PIO
105 F 0008h Reserved
106 F 4000h Physical sector size / logical sector size
107 F 0h Inter-seek delay for ISO-7779 acoustic testing in microseconds
108-111 F varies Unique ID
112-115 F 0h Reserved for world wide name extension to 128 bits
116 V 0h Reserved for technical report
117-118 F 0h Words per logical sector
119 F 4010h Supported settings
120 F 4010h Command set/feature enabled/supported
121-126 F 0h Reserved
127 F 0h Removable Media Status Notification feature set support
128 V 0021h Security status
Table 13. Returned Sector Data (Continued)
Word
F = Fixed
V = Variable
X = Both
Default Value Description
Intel® Solid-State Drive 510 Series
March 2011 Product Specification
Order Number: 325012-001US 23
Drive 510 Series
Notes: F = Fixed. The content of the word is fixed and does not change. For removable media devices, these values may change
when media is removed or changed.
V = Variable. The state of at least one bit in a word is variable and may change depending on the state of the device or
the commands executed by the device.
X = F or V. The content of the word may be fixed or variable.
129-159 X 0h Vendor-specific
160 F 0h CompactFlash Association (CFA) power mode 1
161-168 X 0h Reserved for assignment by the CFA
169 X 0001h Data set management Trim attribute support
170-175 X 0h Reserved for assignment by the CFA
176-205 V 0h Current media serial number
206 X 003Dh SCT Command Transport
207-208 X 0000h Reserved
209 X 0000h Alignment of logical blocks within a physical block
210-211 X 0000h Write-Read-Verify Sector Count Mode 3 (DWord)
212-213 X 0000h Write-Read-Verify Sector Count Mode 2 (DWord)
214 X 0000h NV Cache Capabilities
215-216 X 0000h NV Cache Size in Logical Blocks (DWord)
217 X 0001h Nominal media rotation rate
218 X 0000h Reserved
219 X 0000h NV Cache Options
220 X 0000h Write-Read-Verify feature set
221 X 0000h Reserved
222 X 103Fh Transport major version number
223 X 0000h Transport minor version number
224-229 X 0000h Reserved
230-233 X 0000h Extended Number of User Addressable Sectors (QWord)
234 X 0001h Minimum number of 512-byte data blocks per DOWNLOAD MICROCODE
command for mode 03h
235 X 0200h Maximum number of 512-byte data blocks per DOWNLOAD MICROCODE
command for mode 03h
236-254 X 0000h Reserved
255 X varies Integrity word
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